Optimization of the Peak-to-Background Ratio and the Low Energy Response of Silicon Drift Detectors for High Resolution X-ray Spectroscopy

Autor:	Gerhard Schaller, A. Liebl, Florian Schopper, Peter Lechner, R. Eckhard, Antonio Francesco Longoni, G. Lutz, Adrian Niculae, Lothar Strüder, Heike Soltau
Rok vydání:	2006
Předmět:	X-ray spectroscopy Materials science Low energy Silicon chemistry business.industry Detector Analytical chemistry chemistry.chemical_element Optoelectronics High resolution business Instrumentation
Zdroj:	Microscopy and Microanalysis. 12:862-863
ISSN:	1435-8115 1431-9276
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bea7be38d2f564ab26234b2a91939ac0 https://doi.org/10.1017/s1431927606068383 Zobrazit plný text záznamu