Smear Generation at the Head-Disk Interface and Implications for Reliability

Autor:	Thomas Nguyen, Vedantham Raman
Rok vydání:	2018
Předmět:	010302 applied physics Reliability (semiconductor) Computer science Component (UML) 0103 physical sciences 02 engineering and technology Head disk interface 021001 nanoscience & nanotechnology 0210 nano-technology Interface design 01 natural sciences Reliability engineering
Zdroj:	2018 Asia-Pacific Magnetic Recording Conference (APMRC).
DOI:	10.1109/apmrc.2018.8601072
Popis:	The generation of smears at head-disk interfaces operating at clearances in the range from 1–2 nm represents an increasing challenge- both to component designers as well as those interested in reliable operation of magnetic recording devices over extended periods. In this work, we examine the chemical and topographical nature of these smears, the experimental conditions under which they form and discuss methodologies to limit the generation of these smears. We discuss both “intrinsic” and “extrinsic” smears and highlight the importance of interface design in order to assure long term reliability.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::be9b8e39cfc6c413e2b3db8a8ed587d2 https://doi.org/10.1109/apmrc.2018.8601072 Zobrazit plný text záznamu