Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal
| Autor: | Peter Sarson, Kosuke Machida, Tomonori Yanagida |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Frequency response
Signal generator Computer science 020208 electrical & electronic engineering 020206 networking & telecommunications 02 engineering and technology Modulation 0202 electrical engineering electronic engineering information engineering Electronic engineering Baseband Chirp Radio frequency Electrical and Electronic Engineering Frequency mixer Group delay and phase delay |
| Zdroj: | Journal of Electronic Testing. 34:233-253 |
| ISSN: | 1573-0727 0923-8174 |
| DOI: | 10.1007/s10836-018-5708-y |
| Popis: | This paper discusses the implementation possibilities for making Group Delay measurements of RF frequency converting devices using a standard RF semiconductor Automatic Test Equipment (ATE) that cannot be done using the standard S-parameter measurement due to the difference in frequency from the input to the output of the device. We discuss how using a chirp waveform modulating an RF generator can be used to sweep the frequency response of a RF frequency-converting device and how to produce such a modulation waveform in digital signal processing. We will describe how to implement a group delay test based on our previous work in the baseband domain and how to understand the errors pertaining to measuring a Radio Frequency Receiver. The measurement of the Group Delay of an RF front-end filter and post down convert IF filter will be demonstrated. We will also describe how to produce and maintain a stable frequency reference so that any down converted signal would be a true representation of the modulation signal applied to the RF Source and not corrupted by Phase Noise. We will show how to implement a group delay test based on our previous work in the baseband domain and how to understand the errors pertaining to measuring a radio frequency receiver. The measurement of the group delay of an RF mixer and pre and post down convert RF/IF filters will be demonstrated. The central goal of this paper is to demonstrate how a group delay test can be done at RF, with a frequency translating device, in a cheap and effective manner on semiconductor Automatic Test Equipment in a production environment. |
| Databáze: | OpenAIRE |
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