FOXFET biassed microstrip detectors
| Autor: | Paul Seller, A.D. Lucas, John Hill, Phillip Allport, A.A. Carter, M. J. Goodrick, V. Gibson, C.D. Wilburn, N.M. Greenwood, J. R. Carter, M. Bullough, L. Nardini, T.W. Pritchard, S.L. Thomas, S G Katvars |
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| Rok vydání: | 1991 |
| Předmět: |
Very-large-scale integration
Physics Nuclear and High Energy Physics Large Hadron Collider Physics::Instrumentation and Detectors business.industry Detector STRIPS Dynamic resistance law.invention law Optoelectronics High Energy Physics::Experiment business Instrumentation Silicon microstrip detectors Voltage Leakage (electronics) |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 310:155-159 |
| ISSN: | 0168-9002 |
| DOI: | 10.1016/0168-9002(91)91016-o |
| Popis: | A method has been developed for biassing the strips of a silicon microstrip detector with a tunable dynamic resistance. This allows the strip potentials to be tied to a fixed voltage, virtually independent of the strip leakage currents, whilst requiring no processing steps additional to those needed for a standard capacitively coupled detector. Results are presented for full sized detectors (3.3 cm × 6.0 cm) both measured on a probe station and equipped with VLSI readout (MX3) chips. Assemblies are currently undergoing beam tests at CERN with indications of very promising performance. |
| Databáze: | OpenAIRE |
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