Cantilever contribution to the total electrostatic force measured with the atomic force microscope
| Autor: | Svetlana Guriyanova, Elmar Bonaccurso, Dmytro S. Golovko |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Kelvin probe force microscope
Cantilever Materials science Applied Mathematics Electrostatic force microscope Surface force Atomic force acoustic microscopy Conductive atomic force microscopy Molecular physics Classical mechanics Magnetic force microscope Instrumentation Engineering (miscellaneous) Non-contact atomic force microscopy |
| Zdroj: | Measurement Science and Technology. 21:025502 |
| ISSN: | 1361-6501 0957-0233 |
| DOI: | 10.1088/0957-0233/21/2/025502 |
| Popis: | The atomic force microscope (AFM) is a powerful tool for surface imaging at the nanometer scale and surface force measurements in the piconewton range. Among long-range surface forces, the electrostatic forces play a predominant role. They originate if the electric potentials of the substrate and of the tip of the AFM cantilever are different. A quantitative interpretation of the AFM signal is often difficult because it depends in a complicated fashion on the cantilever–tip–surface geometry. Since the electrostatic interaction is a long-range interaction, the cantilever, which is many microns from the surface, contributes to the total electrostatic force along with the tip. Here we present results of the electrostatic interaction between a conducting flat surface and horizontal or tilted cantilevers, with and without tips, at various distances from the surface. As addressed in a previous work, we show that the contribution of the cantilever to the overall force cannot be neglected. Based on a predictive model and on 3D confocal measurements, we discuss the influence of the tilting angle of the cantilever. |
| Databáze: | OpenAIRE |
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