High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound

Autor:	Mitsuhiro Matsuda, E. Okunishi, Toru Hara, Minoru Nishida
Rok vydání:	2007
Předmět:	Crystallography Cooling rate Materials science Condensed matter physics Scanning transmission electron microscopy Boundary (topology) High angle Condensed Matter Physics Microstructure Dark field microscopy
Zdroj:	Philosophical Magazine Letters. 87:59-64
ISSN:	1362-3036 0950-0839
DOI:	10.1080/09500830601105667
Popis:	High-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) with Z-contrast is applied to characterize the antiphase boundary (APB) of the B2 structure in a rapidly solidified TiPd melt-spun compound. The atomic shift associated with the R = (1/2) a 0 ⟨111⟩ type displacement vector is directly observed at the boundary. A microstructure modification of the melt-spun compound with the cooling rate during solidification is also described.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::be4cdf5ce877ddc582213103d3df0cc8 https://doi.org/10.1080/09500830601105667 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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