Exciton Diffusion in GaN Epitaxial Layers

Autor: A. A. Gladyshchuk, Michael Heuken, Yu. Rakovich, Bernd Schineller, G. P. Yablonskii, John F. Donegan
Rok vydání: 2001
Předmět:
Zdroj: physica status solidi (b). 228:493-496
ISSN: 1521-3951
0370-1972
DOI: 10.1002/1521-3951(200111)228:2<493::aid-pssb493>3.0.co;2-6
Popis: The photoluminescence (PL) and reflection excitonic spectra of GaN epitaxial layers grown on sapphire substrate by MOVPE were measured in the temperature region from 50 to 200 K. A three-layer model of the crystal was used for fitting the reflection spectrum. In this way the dead layer thickness, resonance energies and the broadening parameters of the free excitons were obtained. These parameters were then used for fitting the PL spectra assuming a thermal equilibrium for excitons. A decrease in the diffusion coefficient and increase in the radiative lifetime of excitons was found with increasing temperature.
Databáze: OpenAIRE