Fastpath: a path-delay test generator for standard scan designs

Autor:	Sungho Kang, Haluk Konuk, Bill Underwood, Wai-on Law
Rok vydání:	2002
Předmět:	Vehicle dynamics Automatic test equipment Test generator business.industry Robustness (computer science) Path delay Logic testing Electronic engineering System testing business Automatic testing Computer hardware Mathematics
Zdroj:	ITC
DOI:	10.1109/test.1994.527946
Popis:	Fastpath generates non-robust, robust or single-path-sensitization hazard-free robust path-delay tests for standard scan designs including high-impedance elements and functionally-described blocks. Results show effective and memory-efficient operation.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bda2630252e7257fcd63e5bca3e0b785 https://doi.org/10.1109/test.1994.527946 Zobrazit plný text záznamu