Two-dimensional image magnification in an asymmetric-reflection X-ray microscope

Autor:	Alexey Buzmakov, R. A. Senin, A. A. Pertsov, I. S. Smirnov, Viktor E. Asadchikov, A. V. Andreev, Yu. V. Ponomarev, S. V. Shestov, Sergey Kuzin, V. N. Shkurko, A. A. Konovko
Rok vydání:	2007
Předmět:	Physics Microscope Physics and Astronomy (miscellaneous) Solid-state physics business.industry Detector Magnification Field of view law.invention Reflection (mathematics) Optics law business X-ray microscope
Zdroj:	JETP Letters. 85:98-100
ISSN:	1090-6487 0021-3640
Popis:	The experimental results on the two-dimensional 20× magnification of an x-ray image obtained in an asymmetric-reflection x-ray microscope with the use of a laboratory source of x rays are discussed. The field of view is determined by the linear sizes of the detector and is equal to 0.5 × 0.5 mm in our experiment for an exposure time of 600 s.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bd900904eba99423bdb55a460a259d7e https://doi.org/10.1134/s0021364007010213 Zobrazit plný text záznamu Plný text ve formátu PDF