Image-coupling methods in CCD cameras for Electron Microscopy
| Autor: | O. L. Krivanek, P. E. Mooney |
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| Rok vydání: | 1994 |
| Předmět: | |
| Zdroj: | Proceedings, annual meeting, Electron Microscopy Society of America. 52:406-407 |
| ISSN: | 2690-1315 0424-8201 |
| Popis: | It is well established that the charge-coupled device (CCD) is the detector of choice in imaging applications requiring sensitivity, dynamic range, linearity and low geometric distortion. It has also been shown that in the electron microscope, indirect coupling of the image by a scintillator and transfer optic is required to prevent damage to the CCD and to allow for sufficient dynamic range. The question then follows how best to design the coupling to achieve the image quality required for digital imaging in electron microscopy.We have characterized slow-scan CCD cameras with three representative optical couplings (Figure 1):1:1 fiber-optically coupled camera with a large-pixel CCD (TK1024) and both single-crystal and powder scintillators for 100-400 kV applications requiring good sensitivity,1:1 tandem lens-coupled camera with a large-pixel CCD (TK1024) and a powder scintillator mounted on an ultra-thin Al foil for high voltage applications, and3:1 reduction macro lens-coupled camera with a fast, small-pixel CCD (Kodak MegaPlus) and thin scintillator mounted on a glass prism for applications requiring fast read-out, but not high sensitivity.In this abstract we compare the three coupling methods to each other, and also to a TV-rate fiber-optically coupled CCD camera. |
| Databáze: | OpenAIRE |
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