De-embedding intrinsic parameters of high-Q dielectric resonators from noisy measurements
| Autor: | K. Naishadham |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Coupling
Engineering business.industry Spectral density estimation Dielectric Condensed Matter Physics Noise (electronics) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Background noise Resonator Optics Scattering parameters Electronic engineering Electrical and Electronic Engineering business Microwave |
| Zdroj: | Microwave and Optical Technology Letters. 48:1453-1458 |
| ISSN: | 1098-2760 0895-2477 |
| DOI: | 10.1002/mop.21730 |
| Popis: | The low losses of electromagnetically coupled dielectric resonators render the measured scattering parameters very sensitive to background “noise” contributed by the coupling mechanism, package modes, radiation, and so forth. It becomes important to properly calibrate out this parasitic influence in order to accurately measure the unloaded Q. We report a robust software calibration procedure based on a state-space spectral estimation method, which filters out the background noise and facilitates linear extraction of the unloaded Q. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 1453–1458, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21730 |
| Databáze: | OpenAIRE |
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