Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux

Autor:	M. M. Al Chawa, C. de Benito, H. Castan, S. Duenas, S. G. Stavrinides, R. Tetzlaff, R. Picos
Rok vydání:	2022
Zdroj:	2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST).
DOI:	10.1109/mocast54814.2022.9837658
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bc358fd19be813cb74242a02d9e0219f https://doi.org/10.1109/mocast54814.2022.9837658 Zobrazit plný text záznamu