Study of nonlinear optical absorption in undoped and Al doped NiO thin film
| Autor: | Pratima Sen, Pranay K. Sen, Priyanka Baraskar, Ram Janay Choudhary |
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| Rok vydání: | 2020 |
| Předmět: |
Diffraction
Morphology (linguistics) Materials science genetic structures business.industry Doping Non-blocking I/O technology industry and agriculture eye diseases Condensed Matter::Soft Condensed Matter Condensed Matter::Materials Science Nonlinear optical Condensed Matter::Superconductivity Optoelectronics Condensed Matter::Strongly Correlated Electrons sense organs Thin film business Absorption (electromagnetic radiation) Excitation |
| Zdroj: | AIP Conference Proceedings. |
| ISSN: | 0094-243X |
| DOI: | 10.1063/5.0001726 |
| Popis: | We report the experimental study of the nonlinear optical properties in pulsed laser deposited undoped and Al doped NiO thin films at an excitation energy (≈1.95 eV). Crystalline properties of thin films were investigated using grazing incidence X-ray diffraction (GIXRD) technique confirmed the cubic structure of the grown thin films. The surface morphology of the grown thin films were studied using atomic force microscopy (AFM). It demonstrated the spherical and rectangular shape of grains for undoped and Al doped NiO thin films, respectively. We performed Z-scan technique to determine the nonlinear optical properties of the thin films. We obtain positive and negative absorptive nonlinearity in undoped and Al doped NiO thin films, respectively. The sign reversal of optical nonlinearity suggests the utility of the grown films for optoelectronic device application. |
| Databáze: | OpenAIRE |
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