Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films
| Autor: | Kerstin Volz, Mario F. Zscherp, Celina Becker, Matthias T. Elm, Andreas Beyer, Jonas Glaser, Pascal Cop, Jörg Schörmann |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
010405 organic chemistry General Chemistry Electrolyte 010402 general chemistry Condensed Matter Physics Epitaxy 01 natural sciences 0104 chemical sciences Characterization (materials science) Atomic layer deposition Chemical engineering General Materials Science Cubic zirconia Thin film Porosity Yttria-stabilized zirconia |
| Zdroj: | Crystal Growth & Design. 20:2194-2201 |
| ISSN: | 1528-7505 1528-7483 |
| Popis: | Yttria-stabilized zirconia (YSZ) is a well-known solid electrolyte material in high-temperature applications that involve the conduction of oxygen ions. One possible way of enhancing the performanc... |
| Databáze: | OpenAIRE |
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