X‐Ray Diffraction Study of Argon Crystal Growth

Autor:	D. N. Batchelder, O. G. Peterson, R. O. Simmons
Rok vydání:	1965
Předmět:	Diffraction Materials science Argon Physics::Optics General Physics and Astronomy chemistry.chemical_element Crystal growth Microstructure Crystal Condensed Matter::Materials Science Crystallography chemistry Condensed Matter::Superconductivity Lattice (order) X-ray crystallography Crystal twinning
Zdroj:	Journal of Applied Physics. 36:2682-2685
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1714560
Popis:	Diffraction studies were carried out near 4°K on the influence of rate and method of growth upon the perfection and microstructure of 99.998% purity argon crystals. The crystallography of the twinning observed was directly verified to be of the type expected for a fcc crystal. Some idea of the dislocation content of a well‐annealed argon crystal was obtained. It was concluded that it should be possible to produce crystals having a perfection adequate for a variety of quantitative lattice studies.
Databáze:	OpenAIRE
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