High Efficiency and Low Overkill Testing for Probabilistic Circuits
| Autor: | Shi-Tang Liu, Ming-Ting Lee, Chen-Hung Wu, Cheng-Yun Hsieh, James Chien-Mo Li |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Multivariate statistics Correctness Repetition (rhetorical device) Computer science Probabilistic logic 01 natural sciences Power (physics) Reliability engineering Power consumption 0103 physical sciences 010306 general physics Electronic circuit Statistical hypothesis testing |
| Zdroj: | ITC-Asia |
| Popis: | Probabilistic circuits are a potential solution for low power designs which trade off correctness for power consumption. The behavior of probabilistic circuits are more complicated than deterministic circuits because the former produce different outputs given the same inputs. We need to apply test pattern many times to obtain output distribution of probabilistic circuits. In this paper, we apply multivariate hypothesis testing to reduce pattern repetition. We also reduce overkill by tomographic testing to determine pass or fail of CUT. Experimental results show that our proposed technique can reduce pattern repetition by 82% and reduce overkill by 99%. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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