Performance assessment and RUL prediction of power converters under the multiple components degradation

Autor:	Akanksha Chaturvedi, Monalisa Sarma, Sanjay K. Chaturvedi, Joseph Bernstein
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 144:114958
ISSN:	0026-2714
DOI:	10.1016/j.microrel.2023.114958
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bbbd25c5d5f119f509bc9e2bee358c25 https://doi.org/10.1016/j.microrel.2023.114958 Zobrazit plný text záznamu Full Text from ScienceDirect