Design and Verification of Analog CMOS Circuits Using the gm/ID-Method with Age-Dependent Degradation Effects

Autor:	Nico Hellwege, Marco Erstling, Timur Schafer, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen
Rok vydání:	2017
Předmět:	Materials science CMOS Electronic engineering Age dependent Electrical and Electronic Engineering Degradation (telecommunications) Electronic circuit
Zdroj:	Journal of Low Power Electronics. 13:135-147
ISSN:	1546-1998
DOI:	10.1166/jolpe.2017.1469
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bba4090959586000f34bcfcf08463a2d https://doi.org/10.1166/jolpe.2017.1469 Zobrazit plný text záznamu