Toward designing back-illuminated CMOS image sensor based on 3D modeling
| Autor: | Y. G. Xiao, Z. Q. Li, Z. M. S. Li, Y. Fu, Y. J. Zhou, K. Uehara, M. Lestrade |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
CMOS sensor
Pixel Computer science business.industry 020208 electrical & electronic engineering ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Finite-difference time-domain method 02 engineering and technology 3D modeling 01 natural sciences 010309 optics CMOS 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering Optoelectronics Quantum efficiency Sensitivity (control systems) Image sensor business ComputingMethodologies_COMPUTERGRAPHICS |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.2213549 |
| Popis: | Three-dimensional (3D) modeling is reported for CMOS active pixel image sensors particularly by comparing front surface and back-surface illumination. The opto-electronic responses are presented versus various power intensity and illumination wavelength. The optical efficiency and quantum efficiency from FDTD modeling are also presented. For appropriately designed sensor structure, it is shown that back-surface illumination pixel could achieve improved sensitivity within certain wavelength range. The presented results demonstrate a methodological and technical capability for 3D modeling optimization of complex CMOS image sensor. |
| Databáze: | OpenAIRE |
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