| Autor: | Anna M. Brosa, Joan Figueras |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Engineering
business.industry Transistor Electrical engineering NAND gate Biasing Hardware_PERFORMANCEANDRELIABILITY law.invention Characterization (materials science) Domain (software engineering) Computer Science::Hardware Architecture Computer Science::Emerging Technologies law Hardware_INTEGRATEDCIRCUITS Electronic engineering Hardware_ARITHMETICANDLOGICSTRUCTURES Electrical and Electronic Engineering business Gate equivalent Hardware_LOGICDESIGN Floating body effect Electronic circuit |
| Zdroj: | Journal of Electronic Testing. 14:23-31 |
| ISSN: | 0923-8174 |
| DOI: | 10.1023/a:1008388903741 |
| Popis: | A unified approach to tackle the characterization of the floating gate defect in analog and mixed-signal circuits is introduced. An electrical level model of the defective circuit is proposed extending previous models used effectively in the digital domain. The poly-bulk, poly-well, poly-power rail and metal-poly capacitances are significant parameters in determining the behavior of the floating gate transistor. The model is used to analyze the feasibility of testing a simple analog cell with the floating gate defects through the observation of the quiescent current consumption and the dynamic behavior. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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