Deep-Ultraviolet Thermoreflectance Thermal Imaging of GaN High Electron Mobility Transistors
Autor: | Daniel C. Shoemaker, Anwarul Karim, Dustin Kendig, Hyungtak Kim, Sukwon Choi |
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Rok vydání: | 2022 |
Zdroj: | 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm). |
Databáze: | OpenAIRE |
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