Deep-Ultraviolet Thermoreflectance Thermal Imaging of GaN High Electron Mobility Transistors

Autor:	Daniel C. Shoemaker, Anwarul Karim, Dustin Kendig, Hyungtak Kim, Sukwon Choi
Rok vydání:	2022
Zdroj:	2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bb5c355793178fb6681dad7936bd66b0 https://doi.org/10.1109/itherm54085.2022.9899680 Zobrazit plný text záznamu