Chemical bond formation during laser bonding of Teflon® FEP and titanium
| Autor: | Ronald J. Baird, Rahul Patwa, Hans Herfurth, Gregory W. Auner, Erik F. McCullen, Golam Newaz, Grigor L. Georgiev |
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| Rok vydání: | 2009 |
| Předmět: |
Auger electron spectroscopy
Scanning electron microscope Analytical chemistry Energy-dispersive X-ray spectroscopy General Physics and Astronomy chemistry.chemical_element Surfaces and Interfaces General Chemistry Condensed Matter Physics Surfaces Coatings and Films chemistry.chemical_compound Fluorinated ethylene propylene X-ray photoelectron spectroscopy Chemical bond chemistry Chemical engineering Laser bonding Titanium |
| Zdroj: | Applied Surface Science. 255:7078-7083 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2009.03.046 |
| Popis: | Teflon ® FEP (fluorinated ethylene propylene) is resistant to most chemical solvents, is heat sealable and has low moisture uptake, which make this polymer attractive as a packaging materials for electronics and implantable devices. Teflon ® FEP/Ti microjoints were fabricated by using focused infrared laser irradiation. Teflon ® FEP/Ti interfaces were studied by using X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and scanning electron microscopy coupled with energy dispersive spectroscopy (SEM–EDS). The XPS results give evidence for the formation of Ti–F bonds in the interfacial region. The AES and SEM–EDS results show that the chemical bond formation occurs only in the actual bond area. No evidence for chemical bond formation was found in the heat affected zone surrounding the laser bonds. |
| Databáze: | OpenAIRE |
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