Technique for the removal of electrons from an extracted, pulsed, H− ion beam

Autor:	Luke T. Perkins, P. R. Herz, Ka-Ngo Leung, D. S. Pickard
Rok vydání:	1996
Předmět:	Ion beam deposition Materials science Ion beam Field strength Electron Atomic physics Ion gun Instrumentation Focused ion beam Ion source Ion
Zdroj:	Review of Scientific Instruments. 67:3497-3500
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1147166
Popis:	A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a rf driven multicusp ion source optimized for the production of H− ions and pulsed at a few Hz with pulse widths of several hundreds of μs. It is demonstrated that the insert structure together with a collar can remove over 98% of electrons from the extracted H− ion beam without any significant deterioration of the H− ion output. Application to other negative ion beams can be expected from this magnetic collar insert.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::bafd3bbc33cb79b2bba6080878bff622 https://doi.org/10.1063/1.1147166 Zobrazit plný text záznamu