Phase Intergrowth and Structural Defects in Organic Metal Halide Ruddlesden–Popper Thin Films
| Autor: | Rhys M. Kennard, Clayton J. Dahlman, Michael L. Chabinyc, Jon A. Schuller, Ryan A. DeCrescent, Naveen R. Venkatesan, Erin E. Perry, Hidenori Nakayama |
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| Rok vydání: | 2018 |
| Předmět: |
Diffraction
Photoluminescence Materials science Scattering General Chemical Engineering Halide 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Epitaxy 01 natural sciences 0104 chemical sciences Chemical physics Phase (matter) Materials Chemistry Thin film Selected area diffraction 0210 nano-technology |
| Zdroj: | Chemistry of Materials. 30:8615-8623 |
| ISSN: | 1520-5002 0897-4756 |
| DOI: | 10.1021/acs.chemmater.8b03832 |
| Popis: | Organic metal halide Ruddlesden–Popper layered perovskite phases combine the excellent optoelectronic properties of three-dimensional, bulk hybrid perovskites with superior material stability under ambient conditions. However, the thin film structure of these layered perovskites is still poorly understood, as phase purity is typically determined solely by specular X-ray diffraction. The thin film structure of these Ruddlesden–Popper phases was examined by increasingly local characterization techniques. From the comparison of grazing-incidence wide-angle X-ray scattering patterns of cast films to expected scattering from single-crystal structures, significant in-plane disorder was observed. Spatially localized photoluminescence measurements show that films do not phase separate on the micrometer scale. Selected area electron diffraction measurements show the intergrowth of different phases within the same thin film, consistent with previous observations seen in epitaxially grown Ruddlesden–Popper complex o... |
| Databáze: | OpenAIRE |
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