Molecular complexes on implanted surfaces: unenhanced surface Raman study

Autor:	M.S. Mathur, C.B. Kwok, J.S.C. McKee
Rok vydání:	1991
Předmět:	inorganic chemicals Nuclear and High Energy Physics Chemistry Analytical chemistry Electron Photochemistry Ion Characterization (materials science) symbols.namesake Adsorption Low energy Desorption symbols Raman spectroscopy Instrumentation Raman scattering
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 55:671-675
ISSN:	0168-583X
DOI:	10.1016/0168-583x(91)96255-j
Popis:	The bombardment of surfaces by gaseous ions often results in the formation and adsorption of molecular complexes. Conventional characterization techniques involving low energy electron beams cause desorption of these complexes. The characterization of ion implanted surfaces is undertaken at the University of Manitoba in association with the University of Kentucky by the technique of unenhanced surface Raman scattering with which it is possible to identify the complexes formed as a result of implantation of gaseous ions in various substrates.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::babcf18e1846f9d74e8b8d9afbf7b91a https://doi.org/10.1016/0168-583x(91)96255-j Zobrazit plný text záznamu