Enhanced Cavity Sensor in SIW Technology for Material Characterization
| Autor: | Maurizio Bozzi, Luca Perregrini, Enrico Massoni, Giuseppe Siciliano |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Electromagnetic field
Permittivity Materials science business.industry 010401 analytical chemistry Dielectric permittivity 020206 networking & telecommunications 02 engineering and technology Penetration (firestop) Dielectric Resonant cavity Condensed Matter Physics 01 natural sciences 0104 chemical sciences 0202 electrical engineering electronic engineering information engineering Optoelectronics Dissipation factor Electrical and Electronic Engineering Material under test business |
| Zdroj: | IEEE Microwave and Wireless Components Letters. 28:948-950 |
| ISSN: | 1558-1764 1531-1309 |
| DOI: | 10.1109/lmwc.2018.2864876 |
| Popis: | This letter presents an enhanced solution for low-cost sensors for the determination of the dielectric permittivity and the loss tangent of materials, based on substrate-integrated waveguide (SIW) cavities. The novelty consists in a slight, yet fundamental, modification of the standard sensor topology. The typical structure is based on an SIW resonant cavity with a hole in the middle and a pipe passing through, which contains the material under test. The modification consists in adding a metal sheath that partially covers the walls of the pipe. The metal sheath enhances the penetration of the electromagnetic field into the pipe, thus increasing the sensitivity of the device. Simulation and measurement results of various liquids demonstrate the advantage of the proposed structure. |
| Databáze: | OpenAIRE |
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