Failure Analysis by Infrared and Thermoreflectance Imaging Applied on Active Devices

Autor:	Daniel May, Kenza Jbari, Dominique Carisetti, Ana Borta-Boyon, Patrick Garabedian, Afshin Ziaei, Mohamad Abo Ras, Bernhard Wunderle
Rok vydání:	2022
Zdroj:	2022 28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).
DOI:	10.1109/therminic57263.2022.9950653
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::baa1ce41c45224b50b6563eebf23f853 https://doi.org/10.1109/therminic57263.2022.9950653 Zobrazit plný text záznamu