Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy

Autor:	Koen Vandewal, Martin Breselge, Olivier Douhéret, Jean Manca, Ann Swinnen, Laurence Lutsen, Ludwig Goris
Rok vydání:	2006
Předmět:	Conductive polymer Materials science Physics and Astronomy (miscellaneous) business.industry Analytical chemistry Conductive atomic force microscopy Acceptor Polymer solar cell Characterization (materials science) Organic semiconductor Optoelectronics business Spectroscopy Nanoscopic scale
Zdroj:	Applied Physics Letters. 89:032107
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.2227846
Popis:	Conductive atomic force microscopy (CAFM) is introduced to perform electrical characterization of organic photovoltaic blends with high spatial resolution. Reference blends used in organic bulk heterojunction solar cells are investigated. The ability of CAFM to electrically evidence phase separated donor and acceptor regions is demonstrated. Furthermore, local spectroscopy is performed to analyze charge transport mechanisms in the blends. Significant modifications of the electrical properties of the semiconducting polymers are shown to occur after blending with fullerene derivatives. Finally, the sensitivity of CAFM to photoelectrical phenomena is revealed. Current variations of few picoamperes are locally observed under illumination of P3HT:PCBM.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ba43e7c680f3859ad8b0a598b957c004 https://doi.org/10.1063/1.2227846 Zobrazit plný text záznamu