| Autor: |
Yoshinori Iida, S.-I. Sano, T. Niiyama, Michio Sasaki, F. Masuoka, Takeo Sakakubo, I. Inoue, Naoshi Sakuma, Hidetoshi Nozaki, Yukio Endo, Shinji Ohsawa, Ryohei Miyagawa, Hironaga Honda, Yoshitaka Egawa, Sohei Manabe, Nobuo Nakamura, I. Yanase, Yoshiyuki Matsunaga, Tetsuya Yamaguchi, Yoshiki Ishizuka, N. Endoh, Hirofumi Yamashita, E. Ohba, Hisanori Ihara, H. Ichinose, A. Furukawa |
| Rok vydání: |
2002 |
| Předmět: |
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| Zdroj: |
Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '94. |
| Popis: |
Shrinking pixel size in conventional CCD imagers degrades device performance. Unsatisfactory smear noise of -90 dB is attained in a 2/3-inch 2M pixel CCD imager. The STACK-CCD imager has a great advantage regarding this problem. A 100% aperture ratio and low smear noise are maintained regardless of future pixel shrinking, because CCD scanning circuits are overlaid with an amorphous silicon (a-Si) photoconversion layer. > |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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