Dynamical Oscillations of X-Ray Integrated Intensity in Laue Diffraction and Their Temperature Dependences for Si Dislocation Crystals

Autor:	N. M. Olekhstovich, A. L. Karpei, V. M. Skidan, L. D. Puzenkova
Rok vydání:	1982
DOI:	10.1515/9783112500668-006
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b9e90f2adeafef3a262c40d372f2d902 https://doi.org/10.1515/9783112500668-006 Zobrazit plný text záznamu