Autor: |
S. G. Nascimento, Nemitala Added, Eduardo Luiz Augusto Macchione, A. R. Leite, Y. A. P Aguiar, M. A. G. Silveira, Nilberto H. Medina |
Rok vydání: |
2017 |
Předmět: |
|
Zdroj: |
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS). |
Popis: |
The new setup for Single Event Effects studies at LAFN-USP, Brazil is described in this work. The new beam line is dedicated to production of large area, high uniformity and low intensity heavy-ions beams to irradiate electronic devices. Its design relies on defocusing and multiple scattering techniques to obtain desired beam characteristics. Beam uniformity measured was better than 90%. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|