Development of an X-ray photoelectron microscopic system with a compact X-ray source
Autor: | CHIEMI FUJIKAWA, NAOHIRO YAMAGUCHI, TADAYUKI OHCHI, TAMIO HARA, KATSUMI WATANABE, IBUKI TANAKA, MASAMI TAGUCHI |
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Rok vydání: | 2002 |
Předmět: | |
Zdroj: | Laser and Particle Beams. 20:39-42 |
ISSN: | 1469-803X 0263-0346 |
Popis: | We have constructed an X-ray photoelectron microscopic system. An X-ray source is a laser-produced plasma in a scheme of an X-ray laser experiment. X rays involving amplified spontaneous emissions (ASE) at 15.47 nm were delivered with a 10-Hz repetition rate from a compact X-ray laser system. X rays were collected and focused by a Schwarzschild optics coated with Mo/Si multilayers for a 15.47-nm X ray. Photoelectron signals due to the Ga 3d and As 3d electrons were observed, when a GaAs wafer was used as a sample. The spatial resolution of about 1 μm was confirmed. |
Databáze: | OpenAIRE |
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