Mass Spectrometer Ion Source with High Yield

Autor:	D. L. Swingler
Rok vydání:	1970
Předmět:	Ion beam Chemistry General Physics and Astronomy Mass spectrometry Ion gun Ion source law.invention Secondary ion mass spectrometry Ion beam deposition Physics::Plasma Physics Reflectron law Atomic physics Electron ionization
Zdroj:	Journal of Applied Physics. 41:1496-1499
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1659062
Popis:	An electron impact ion source suitable for use with a quadrupole mass filter is described. Ion formation occurs throughout a relatively large volume since no magnetic field collimation of the ionization electron stream is used. A sensitivity of 8 Torr−1 was obtained for an ion energy of 50 eV rising to a constant sensitivity of 12 Torr−1 for ion energies in excess of 250 eV. Trajectory tracing has been used to give some insight into the efficient operation of the ion source.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b953938529182942d285f7b2db20c034 https://doi.org/10.1063/1.1659062 Zobrazit plný text záznamu