Sub-nanometer resolution over several microns range with real-time dual-wavelength digital holographic microscopy

Autor:	Christian Depeursinge, Jonas Kühn, Florian Charrière, Tristan Colomb, Christophe Pache
Rok vydání:	2008
Předmět:	Wavefront Materials science business.industry Resolution (electron density) Holography Phase (waves) law.invention Interferometry Optics law Microscopy Digital holographic microscopy business Digital holography
Zdroj:	Digital Holography and Three-Dimensional Imaging.
DOI:	10.1364/dh.2008.dtuc2
Popis:	Single-acquisition dual-wavelength digital holographic microscopy provides real-time phase measurement range over several microns. We demonstrate axial resolution enhancement down to sub-nanometer range thanks to the non-correlation between both available wavefronts.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b8f6895cebbf1793eb7dff57b439624e https://doi.org/10.1364/dh.2008.dtuc2 Zobrazit plný text záznamu