Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry

Autor:	Luc Moens, Frank Vanhaecke, Martín Resano, Marieke Verstraete
Rok vydání:	2002
Předmět:	Detection limit Analyte Chromatography Trace Amounts Silicon Analytical chemistry chemistry.chemical_element Standard solution Analytical Chemistry law.invention chemistry law Vaporization Atomic absorption spectroscopy Inductively coupled plasma mass spectrometry Spectroscopy
Zdroj:	Journal of Analytical Atomic Spectrometry. 17:897-903
ISSN:	1364-5544 0267-9477
DOI:	10.1039/b200749p
Popis:	In this work, a method has been developed for the fast and reliable determination of silicon in polyamides (two samples with silicon contents of 10 and 50 µg g−1 were analyzed) by means of solid sampling electrothermal vaporization ICP-MS. For all silicon isotopes, the occurrence of spectral interferences was studied as a function of the vaporization temperature. The benefits of the use of palladium as a chemical modifier were investigated. Finally, a vaporization temperature of 2400 °C, monitoring of 29Si+ and the addition of 1 µg of palladium were found to be the optimum conditions for the determination. The method finally proposed shows very interesting features for this particular element: the ability to use aqueous standard solutions for calibration, a low sample consumption (a few milligrams only), a high sample throughput (20 min analysis time per sample), a low limit of detection (0.3 µg g−1) and a reduced risk of analyte losses and, particularly, of contamination. Additionally, the approach also exhibits multi-element capabilities.
Databáze:	OpenAIRE
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