Study of Turns Impact on ESD-immunity of High-voltage nLDMOSs with a Constant Floating-poly

Autor: Xing-Chen Mai, Xiu-Yuan Yang, Shen-Li Chen, Ting-En Lin, Yu-Jie Chung
Rok vydání: 2022
Zdroj: 2022 IEEE 4th Eurasia Conference on IOT, Communication and Engineering (ECICE).
DOI: 10.1109/ecice55674.2022.10042892
Databáze: OpenAIRE