Optimizing C60 incidence angle for polymer depth profiling by ToF-SIMS
| Autor: | Mineharu Suzuki, Gregory L. Fisher, Shin-ichi Iida, Takuya Miyayama, Scott R. Bryan, Noriaki Sanada |
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| Rok vydání: | 2010 |
| Předmět: |
chemistry.chemical_classification
Materials science Fullerene Ion beam Analytical chemistry Surfaces and Interfaces General Chemistry Polymer Condensed Matter Physics Surfaces Coatings and Films Ion chemistry.chemical_compound chemistry Sputtering visual_art Materials Chemistry visual_art.visual_art_medium Polystyrene Polycarbonate |
| Zdroj: | Surface and Interface Analysis. 43:214-216 |
| ISSN: | 0142-2421 |
| Popis: | The introduction of C 60 + as a sputter ion beam for ToF-SIMS has made it possible to acquire molecular depth profiles on a wide varietyof polymers. However, previous studies have indicated that certain classes of polymers undergo sputter-induced damage when bombarded with C 60 + that prevents obtaining stable molecular secondary ion signals as a function of depth. A number of different analytical parameters have been previously explored in attempts to improve depth profiling of these polymer classes. In this study, the effect of C 60 + incident angle on the ability to depth profile polycarbonate (PC) and polystyrene (PS) was investigated at angles from 48° to 76° with respect to the sample normal. This study indicates that the highest sputtering angle provided the best conditions for molecular depth profiling. |
| Databáze: | OpenAIRE |
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