Ellipsometry of guided wave polaritons at solid surfaces
| Autor: | I. I. Burshta, S. N. Zavadskii, E. F. Venger |
|---|---|
| Rok vydání: | 1994 |
| Předmět: |
Materials science
Guided wave testing business.industry Physics::Optics Surfaces and Interfaces Condensed Matter Physics Electromagnetic radiation Refraction Surfaces Coatings and Films Optics Ellipsometry Materials Chemistry Polariton Optoelectronics Prism business Absorption (electromagnetic radiation) Refractive index |
| Zdroj: | Surface Science. 301:399-404 |
| ISSN: | 0039-6028 |
| DOI: | 10.1016/0039-6028(94)91319-6 |
| Popis: | A new method is proposed for studying surfaces in the region of resonance interaction of electromagnetic radiation with surface elementary excitations. In this method the sample surface is illuminated through the ATR prism having a thin metallic layer on its base, and the ellipsometric angles of the reflected beam are measured. We have studied ellipsometry in measuring refraction and absorption indices at the surface. A substantial improvement of sensitivity was demonstrated. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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