Autor: |
D. R. Jennison, K Shepherd, C. Niu, J. Tong, D Martini, Alexander Bogicevic, Jeffry A. Kelber |
Rok vydání: |
2000 |
Předmět: |
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Zdroj: |
Surface Science. 465:163-176 |
ISSN: |
0039-6028 |
DOI: |
10.1016/s0039-6028(00)00728-7 |
Popis: |
XPS studies and first principles calculations compare Cu adsorption on heavily hydroxylated sapphire (0001) with a dehydroxylated surface produced by Ar{sup +} sputtering followed by annealing in O{sub 2}. Annealing a cleaned sapphire sample with an O{sub 2} partial pressure of {approximately}5 x 10{sup {minus}6} Torr removes most contaminants, but leaves a surface with {approximately}0.4ML carbon and {approximately}0.4ML OH. Subsequent light (6 min.) Ar ion sputtering at 1 KeV reduces the carbon to undetectable levels but does not dehydroxylate the surface. Further sputtering at higher Ar ion excitation energies (>2 KeV) partially dehydroxylates the surface, while 5 KeV Ar ion sputtering creates oxygen vacancies in the surface region. Further annealing in O{sub 2} repairs the oxygen vacancies in the top layers but those beneath the surface remain. Deposition of Cu on the hydroxylated surface at 300 K results in a maximum Cu(I) coverage of {approximately}0.35 ML, in agreement with theoretical predictions. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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