New design of transient-noise detection circuit with SCR device for system-level ESD protection

Autor:	Wan-Yen Lin, Ming-Dou Ker
Rok vydání:	2012
Předmět:	Engineering Electrostatic discharge business.industry Firmware Thyristor Hardware_PERFORMANCEANDRELIABILITY computer.software_genre Transient noise Hardware_INTEGRATEDCIRCUITS Silicon chip Electronic engineering System level Microelectronics Transient (oscillation) business computer
Zdroj:	NEWCAS
DOI:	10.1109/newcas.2012.6328961
Popis:	A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-µm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b814ea09f61c146455220c10d2307ead https://doi.org/10.1109/newcas.2012.6328961 Zobrazit plný text záznamu