Autor:	Jiann Min Chin
Rok vydání:	2019
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 102:113483
ISSN:	0026-2714
DOI:	10.1016/j.microrel.2019.113483
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b7f770704480866d26d76909060630f3 https://doi.org/10.1016/j.microrel.2019.113483 Zobrazit plný text záznamu Full Text from ScienceDirect