A study of crystal lattice fringe observation using the 30kV STEM

Autor:	S. Takeshi
Rok vydání:	2012
Předmět:	Materials science Condensed matter physics Crystal structure Instrumentation
Zdroj:	Microscopy and Microanalysis. 18:372-373
ISSN:	1435-8115 1431-9276
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b7d1773307e480a746fbf9951d822fbc https://doi.org/10.1017/s1431927612003716 Zobrazit plný text záznamu