Application and analysis of IDDQ diagnostic software

Autor:	Franco Motika, Donato O. Forlenza, Phillip J. Nigh
Rok vydání:	2002
Předmět:	Stuck-at fault Engineering Software Application-specific integrated circuit business.industry Fault coverage Hardware_PERFORMANCEANDRELIABILITY Test method Automatic test pattern generation Fault (power engineering) business Iddq testing Reliability engineering
Zdroj:	ITC
DOI:	10.1109/test.1997.639633
Popis:	A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large database of defects uniquely detected with this test method. We present a methodology for performing defect localization based upon IDDq test information (only). Using this technique, fault localization can be completed within minutes (e.g.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b7cdf2542ebfd2faf574a0ae41b5a2bd https://doi.org/10.1109/test.1997.639633 Zobrazit plný text záznamu