Novel Technique for Determination of Actual Pixel Size in Dense Arrays of Infrared Detectors
| Autor: | Jongwoo Kim, Subrata Halder, Guanghai Ding, James C. M. Hwang, C. Chen, Henry Yuan |
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| Rok vydání: | 2010 |
| Předmět: |
Physics
Pixel Physics::Instrumentation and Detectors business.industry Infrared Bipolar junction transistor Detector Photodetector Electronic Optical and Magnetic Materials Computer Science::Computer Vision and Pattern Recognition Optoelectronics Infrared detector Electrical and Electronic Engineering Image sensor business Dark current |
| Zdroj: | IEEE Electron Device Letters. 31:839-841 |
| ISSN: | 1558-0563 0741-3106 |
| DOI: | 10.1109/led.2010.2049981 |
| Popis: | A novel technique is proposed for determining the actual pixel size in dense arrays of infrared detectors. The technique is based on probing individual pixels in an array and analyzing the parasitic bipolar transistor formed between them to determine the lateral diffusion width and, hence, the actual pixel diameter. The actual pixel diameter can then be used to separate the area-dependent dark current from the periphery-dependent dark current. The result shows that, in the present arrays, the dark current is dominated by the periphery current, unless the pixels are so close to each other that their depletion regions overlap. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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