Next Generation TFT-Array Testing for High Resolution/High Content AMLCDs

Autor:	M. Kodate, Michael Mastro, T. Iwami, Tomoyuki Taguchi, Yoshinori Mekata, Leslie Charles Jenkins, Robert J. Polastre, Frank R. Libsch
Rok vydání:	1999
Předmět:	Amorphous silicon chemistry.chemical_compound Engineering chemistry business.industry Cost effectiveness Thin-film transistor Electrical engineering High resolution Lower cost business Reliability engineering
Zdroj:	SID Symposium Digest of Technical Papers. 30:72
ISSN:	0097-966X
DOI:	10.1889/1.1834129
Popis:	Along with the extraordinary success of low cost amorphous silicon a-Si TFT-LCDs, technical and cost effectiveness of the TFT-array test is today's focus. In this paper we discuss the current TFT-array testing status and show the next generation TFT-array testing method for higher resolution a-Si TFT-LCDs. The benefits of a lower cost testing method without any degradation of the testing quality are discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b7b064badbcacaf75ebdf2b6104fef45 https://doi.org/10.1889/1.1834129 Zobrazit plný text záznamu Plný text