| Autor: |
Sunanda Dixit, Sneha Karamadi, H. Aditya Pai, Piyush Kumar Pareek, M. S. Narasimha Murthy |
| Rok vydání: |
2021 |
| Předmět: |
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| Zdroj: |
Emerging Technologies in Data Mining and Information Security ISBN: 9789811597732 |
| DOI: |
10.1007/978-981-15-9774-9_57 |
| Popis: |
Software defect prediction (SDP) is the method essential for testing during life cycle of the software development (LCSD). It finds out those stages of the software which are more prone towards defect and requires extensive testing. In this way, the testing can be without usage of extra resources. Though SDP is an essential step in the testing, it is not always easy to do the prediction of which stage of the software is having defects. There are various reasons which barriers for the smooth performances of defect prediction. In this paper, we carried out the survey on different IT companies and analyzed their software process model by performing SWOT chart. The chart gave us the idea to perform value stream mapping (VSM) that identifies the non-value added process activities in the IT companies. Also failure effective analysis model (FEAM) to know the outcome or threats over the defects identified. We also came up with the hypothesis for the delay in software development process. ANOVA analysis was carried out to understand the turbulence in the business environment. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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