Analysis of the Endurance of CMOS IC Elements to Failures after Charged Particle Strike

Autor:	Vera P. Smirnova, Tatiana Y. Krupkina, Yury A. Chaplygin, Vladimir D. Meschanov, Aleksey S. Klyuchnikov, Kirill A. Panyshev
Rok vydání:	2022
Zdroj:	2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus).
DOI:	10.1109/elconrus54750.2022.9755791
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b701f9eae62ad2c1f11cf6ef0d27b4f1 https://doi.org/10.1109/elconrus54750.2022.9755791 Zobrazit plný text záznamu