Ferroelectric characterisation using Josephson junctions
| Autor: | C.M. Pegrum, R.J. Romans, Mark G. Blamire, F. Kahlmann, Gavin Burnell, E.J. Tarte, P.F. McBrien, W.E. Booij |
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| Rok vydání: | 2001 |
| Předmět: |
Permittivity
Josephson effect Materials science business.industry Relative permittivity Biasing Dielectric Condensed Matter Physics Ferroelectricity Electronic Optical and Magnetic Materials chemistry.chemical_compound Resonator chemistry Strontium titanate Optoelectronics Electrical and Electronic Engineering business |
| Zdroj: | IEEE Transactions on Appiled Superconductivity. 11:1158-1161 |
| ISSN: | 1051-8223 |
| DOI: | 10.1109/77.919554 |
| Popis: | Measurements of the permittivity of a series of strontium titanate films of various thicknesses at frequencies from 100 to 900 GHz are reported. The permittivity was measured using Josephson junctions coupled to external resonators. The permittivity was found to decrease with decreasing film thickness and was frequency independent. On application of a dielectric bias voltage, the permittivity of a 200 nm film was tunable between 245 and 112 at 30 K. |
| Databáze: | OpenAIRE |
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