Temperature-Aware Evaluation and Mitigation of Logic Soft Errors Under Circuit Variations
| Autor: | Warin Sootkaneung, Sasithorn Chookaew, Suppachai Howimanporn |
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| Rok vydání: | 2021 |
| Zdroj: | 2021 IEEE 30th Asian Test Symposium (ATS). |
| DOI: | 10.1109/ats52891.2021.00018 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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